A short-course on Advanced Characterisation Techniques of Materials at EPFL, Lausanne
The course will cover the following topics:
25-26 August 2010
ESEM (Environmental Scanning Electron Microscopy)
Neutron and X-ray diffraction
X-ray tomography
HR TEM (High Resolution Transmission Electron Microscopy)
FIB (Focused Ion Beam)
EBSD (Electron Backscattered Diffraction)
XPS (X-ray Photoemission Spectroscopy)
Auger Electron Spectroscopy
Tof SIMS (Time-of-flight Secondary Ion Mass Spectroscopy)
AFM (Atomic Force Microscopy)
Nanoindentation, Microhardness
Atomic Emission Spectroscopy, Spark Atomic Emission Spectroscopy
DTA (Differential Thermal Analysis), DSC (Differential Scanning Calorimetry), TG (Thermogravimetry)
27 August 2010
Specific applications of the above techniques
Contribution
Are you interested in contributing a talk? The third day of the course is meant to highlight the various possible applications of the characterisation techniques presented during the first and second days. As part of your registration, you are invited to submit an abstract for a 25 minutes presentation outlining your specific use of characterisation techniques. Abstract selection will take place in June, 2010. Please note that abstract submission is not required to participate in this course.
For further information, please contact Susan Meuwly, .
